Optical reflectivity studies of radiation-induced trace disorder in silicon

✍ Scribed by R.J. Iwanowski; B.J. Kowalski; J. Ba̧k-Misiuk; B.A. Oro̵wski

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 374 KB
• Volume: 70-71
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(93)90450-p