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Optical properties of silicon-nitride atomic-force microscopy tips in scanning tunneling optical microscopy: experimental study

✍ Scribed by Castagne, M. ;Prioleau, C. ;Fillard, J. P.

Book ID: 115343935
Publisher: The Optical Society
Year: 1995
Tongue: English
Weight: 140 KB
Volume: 34
Category: Article
ISSN: 1559-128X
DOI: 10.1364/AO.34.000703

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