Optical properties of a-Ga20Se80−xSbx thin films
✍ Scribed by Zishan H. Khan; M. Zulfequar; T.P. Sharma; M. Husain
- Book ID
- 108028511
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 692 KB
- Volume
- 6
- Category
- Article
- ISSN
- 0925-3467
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Thin films of chemical composition Ge 20 Se 80 and Ag 6 (Ge 0.20 Se 0.80 ) 94 are prepared by thermal evaporation technique. The optical properties of these thin films are determined by a method, based only on the transmission spectra at normal incidence, measured over the 400-2000 nm spectral range
Thin ÿlms of amorphous Se100-xSbx (x = 5; 10 and 20 at%) system are deposited on a silicon substrate at room temperature (300 K) by thermal evaporation technique. The optical constant such as refractive index (n) has been determined by a method based on the envelope curves of the optical transmissio