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Optical properties and band gap characterization of high dielectric constant oxides

โœ Scribed by O. Fursenko; J. Bauer; G. Lupina; P. Dudek; M. Lukosius; Ch. Wenger; P. Zaumseil


Book ID
113937444
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
438 KB
Volume
520
Category
Article
ISSN
0040-6090

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## Abstract A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposited over the lines.Besides the simpli