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Optical phase shift measurement of residual defects in vapor epitaxial GaAsP

✍ Scribed by H.R. Zwicker; D.R. Scifres; N. Holonyak Jr.; R.D. Dupuis; R.D. Burnham; J.W. Burd; Zh.I. Alferov

No coin nor oath required. For personal study only.

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