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Optical models for the ellipsometric characterisation of porous silicon structures

✍ Scribed by P. Petrik; É. Vázsonyi; M. Fried; J. Volk; G. T. Andrews; A. L. Tóth; Cs. S. Daróczi; I. Bársony; J. Gyulai

No coin nor oath required. For personal study only.

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