Optical characterisation of porous silicon layers by spectrometric ellipsometry in the 1.5–5 eV range

✍ Scribed by F. Ferrieu; A. Halimaoui; D. Bensahel

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 379 KB
• Volume: 84
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(92)90124-r