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Optical method for measuring uniform thickness of the order of 10 μm–1 mm of transparent solid and liquid films

✍ Scribed by Ohyama, Tetsuya; Mori, Yasuhiko H.


Book ID
120215291
Publisher
American Institute of Physics
Year
1987
Tongue
English
Weight
859 KB
Volume
58
Category
Article
ISSN
0034-6748

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