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Optical evaluation of ingot fixity in semiconductor wafer slicing

โœ Scribed by T.W Ng; R Nallathamby


Book ID
108233505
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
261 KB
Volume
36
Category
Article
ISSN
0030-3992

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In this paper, a new type of noncontact/nondestructive measuring method has been developed, comprising a new optical probe, precision stages, and controllers. The new optical probe has been designed using the reflected slit beam through the optical window. The optical measurement system has been imp