Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x
✦ LIBER ✦
Optical constants of Cd1 − yMnyTe thin films
✍ Scribed by I. Miotkowski; S. Miotkowska
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 320 KB
- Volume
- 165
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
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## Abstract CdS thin films of varying thicknesses were deposited on cleaned glass substrates at room temperature by thermal evaporation technique in a vacuum of about 2 x 10^‐5^ torr. UV‐VIS spectra of the films were studied using the optical transmittance measurements which were taken in the spect