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Optical characterization of polyethylene films by refractometry

โœ Scribed by E. Bernabeu; J. M. Boix; A. Larena; G. Pinto


Book ID
104741618
Publisher
Springer
Year
1993
Tongue
English
Weight
366 KB
Volume
28
Category
Article
ISSN
0022-2461

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โœฆ Synopsis


Refractometrical measurements of polyethylene films have been obtained using a modified Abbe's refractometer that includes polarized and monochromatic light. The ordinary and extraordinary r.efractive index values have been obtained considering an anisotropic uniaxic modell These values are analysed in relation to the previously known degree of crystallinity in the samples of this material. The specular reflectance is derived from the Fresnel formulae and an evaluation of diffused reflectance has been made. We find that the diffuse reflectance values increase with average roughness of the polyethylene films. This question is of particular interest for the surface characterization of these materials.


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## Abstract Of the several techniques available for surface modification, plasma processing has proved to be very appropriate. The low temperature plasma is a soft radiation source and it affects the material only over a few hundred angstroms deep, the bulk properties remaining unaffected. Plasma s