## Abstract Of the several techniques available for surface modification, plasma processing has proved to be very appropriate. The low temperature plasma is a soft radiation source and it affects the material only over a few hundred angstroms deep, the bulk properties remaining unaffected. Plasma s
Optical characterization of polyethylene films by refractometry
โ Scribed by E. Bernabeu; J. M. Boix; A. Larena; G. Pinto
- Book ID
- 104741618
- Publisher
- Springer
- Year
- 1993
- Tongue
- English
- Weight
- 366 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0022-2461
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โฆ Synopsis
Refractometrical measurements of polyethylene films have been obtained using a modified Abbe's refractometer that includes polarized and monochromatic light. The ordinary and extraordinary r.efractive index values have been obtained considering an anisotropic uniaxic modell These values are analysed in relation to the previously known degree of crystallinity in the samples of this material. The specular reflectance is derived from the Fresnel formulae and an evaluation of diffused reflectance has been made. We find that the diffuse reflectance values increase with average roughness of the polyethylene films. This question is of particular interest for the surface characterization of these materials.
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