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Optical characterization of photonic crystal delay lines based on one-dimensional coupled defects

โœ Scribed by Nishikawa, Satoshi; Lan, Sheng; Ikeda, Naoki; Sugimoto, Yoshimasa; Ishikawa, Hiroshi; Asakawa, Kiyoshi


Book ID
115425651
Publisher
Optical Society of America
Year
2002
Tongue
English
Weight
137 KB
Volume
27
Category
Article
ISSN
0146-9592

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Optical characterization of two-dimensio
โœ Chun-Hung Lin; Hsuen-Li Chen; Wen-Chi Chao; Chung-I Hsieh; Wen-Huei Chang ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 620 KB

A simple and non-destructive optical characterizing method for the 2D photonic crystal (PC) slab was carried out by using specular spectroscopic ellipsometry. The rigorous coupled-wave analysis (RCWA) was further applied to analyze the measured ellipsometric parameters and then to simulate the struc