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Optical characterization of CuIn[sub 1âx]Ga[sub x]Se[sub 2] alloy thin films by spectroscopic ellipsometry

✍ Scribed by Paulson, P. D.; Birkmire, R. W.; Shafarman, W. N.

Book ID: 120013446
Publisher: American Institute of Physics
Year: 2003
Tongue: English
Weight: 536 KB
Volume: 94
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1581345

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