Cartesian graphs constitute an important class of knowledge representation devices. As part of a project on diagrammatic knowledge acquisition we have formulated principles that can underpin the construction, interpretation and use of Cartesian graphs in general and in the speci"c context of knowled
Ontological analysis: an ongoing experiment
β Scribed by James H. Alexander; Michael J. Freiling; Sheryl J. Shulman; Steven Rehfuss; Steven L. Messick
- Publisher
- Elsevier Science
- Year
- 1987
- Weight
- 750 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0020-7373
No coin nor oath required. For personal study only.
β¦ Synopsis
Knowledge engineering is a complex activity which permeated with problems inherent in the difficulties of choosing the correct abstractions. Knowledge-level analysis has been suggested as a technique to help manage this complexity. We have previously presented a methodology, called ontological analysis, which provides a technique for performing knowledge-level analysis of a problem space. This paper presents the experiences weβ’ have gained with knowledge-level analysis. Our experiences are reported and the criteria for a formal knowledge-level analysis language are discussed.
1. Knowledge-level analysis
We have found that neophyte knowledge engineers often "don't know where to start". This roadblock is not usually the result of a lack of understanding about expert systems or representation schemes; but is due to confusion about the appropriate classification of the individual knowledge elements of a domain.
Currently, a knowledge engineer must rely on an intuitive, informal approach to collecting and organizing expert knowledge for a knowledge-based system. Newell (1982) proposed that there should be a knowledge-level analysis to guide the development of AI systems, such as expert systems. Recently (
π SIMILAR VOLUMES
## Abstract In conjoint analysis (CA) studies, choosing between scenarios with multiple health attributes may be demanding for respondents. This study examined whether simplifying the choice task in CA designs, by using a design with more overlap of attribute levels, provides advantages over standa
Semiconductor yield data is binary by nature since an integrated circuit (IC), or die, can only pass or fail a particular test. Still, many people rely on simple linear regression to analyse this type of data, which can produce incorrect results, e.g. negative yield predictions. We discuss the use o