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On–chip multibit–test scheme for VLSI memories

✍ Scribed by Hideto Hidaka; Kazuyasu Fujishima; Masaki Kumanoya; Hideshi Miyatake; Katsumi Dosaka; Yasumasa Nishimura; Tsutomu Yoshihara


Book ID
118283307
Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
628 KB
Volume
71
Category
Article
ISSN
8756-663X

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