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On-wafer calibration algorithm for partially leaky multiport vector network analyzers

✍ Scribed by Teppati, V.; Ferrero, A.

Book ID: 114660423
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 702 KB
Volume: 53
Category: Article
ISSN: 0018-9480
DOI: 10.1109/tmtt.2005.857100

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