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[IEEE Proceedings., IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits - Ithaca, NY, USA (7-9 Aug. 1989)] Proceedings., IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits - A new coplanar waveguide vector network analyzer for on-wafer measurements

✍ Scribed by Bellantoni, J.V.; Compton, R.C.

Book ID: 115457729
Publisher: IEEE
Year: 1989
Weight: 502 KB
Volume: 0
Category: Article
DOI: 10.1109/cornel.1989.79836

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