On the yellow-band emission in CdS films
β Scribed by R. Lozada-Morales; O. Zelaya-Angel; G. Torres-Delgado
- Publisher
- Springer
- Year
- 2001
- Tongue
- English
- Weight
- 142 KB
- Volume
- 73
- Category
- Article
- ISSN
- 1432-0630
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Classified abstracts 444-452 plier, the angular and spectral dcpendences of the quantum yield were determined. From the amplitude distribution of the electron multiplier output, the distribution of the number of emitted photoelectrons per photon was derived. This distribution determines the fluctuat
## Abstract Defectβrelated emission at 2.451 eV in epitaxial CdS films on Si(111) substrates was observed for the first time in lowβtemperatures photoluminescence spectra. Temperature and excitation intensity dependence of the defectβrelated emission were measured to examine its emission mechanism.