On the vacancy formation and diffusion on the Si(111)7×7 surfaces under exposures of low oxygen pressure studied by in situ reflection electron microscopy

✍ Scribed by N. Shimizu; Y. Tanishiro; K. Takayanagi; K. Yagi

• Book ID: 119482098
• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 938 KB
• Volume: 191
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/s0039-6028(87)81046-4