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On the unreliability of the `reliability index'

✍ Scribed by Donohue, J. ;Trueblood, K.


Book ID
114516934
Publisher
International Union of Crystallography
Year
1956
Tongue
English
Weight
150 KB
Volume
9
Category
Article
ISSN
0365-110X

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We investigate a model of gate failure for Boolean circuits in which a faulty gate is restricted to output one of its input values. For some types of gates, the model, which we call the short-circuit model of gate failure, is weaker than the traditional von Neumann model in which faulty gates always