On the threshold voltage shift after Hot Carrier Injection in deep submicron n-channel MOSFETs — A quasi uniform approach

✍ Scribed by C. Papadas; N. Revil; G. Ghibaudo; E. Vincent

• Book ID: 103599430
• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 332 KB
• Volume: 28
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(95)00077-l