## Abstract Although not discussed in most reviews of quantitative xβray photoelectron spectroscopy (XPS), diffraction of the photoelectrons leaving a single crystal can lead to potential errors of a factor of two or more in the calculated surface composition. A series of experimental measurements
β¦ LIBER β¦
On the theory of quantitative in-depth composition information in X-ray photoelectron spectroscopy
β Scribed by Arne L. Tofterup
- Book ID
- 104592341
- Publisher
- John Wiley and Sons
- Year
- 1989
- Tongue
- English
- Weight
- 391 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0142-2421
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