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On the Surface-Roughness Scattering in Biaxially Strained n- and p-MOS Transistors

✍ Scribed by De Michielis, M.; Conzatti, F.; Esseni, D.; Selmi, L.


Book ID
114620577
Publisher
IEEE
Year
2011
Tongue
English
Weight
182 KB
Volume
58
Category
Article
ISSN
0018-9383

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