## Abstract This paper presents a method to characterize the excess noise ratio (ENR) of an unmatched avalanche noise diode for application as an onβwafer noise source. It is based on the determination of a broadband device noise circuitβmodel from its measured reflection coefficient and noise powe
On the shot-noise streamflow model and its applications
β Scribed by Konecny, F.
- Book ID
- 105249156
- Publisher
- Springer
- Year
- 1992
- Tongue
- English
- Weight
- 619 KB
- Volume
- 6
- Category
- Article
- ISSN
- 0931-1955
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