✦ LIBER ✦
Extraction of an avalanche diode noise model for its application as an on-wafer noise source
✍ Scribed by M. C. Maya; A. Lázaro; L. Pradell
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 138 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0895-2477
No coin nor oath required. For personal study only.
✦ Synopsis
Abstract
This paper presents a method to characterize the excess noise ratio (ENR) of an unmatched avalanche noise diode for application as an on‐wafer noise source. It is based on the determination of a broadband device noise circuit‐model from its measured reflection coefficient and noise powers. Measured ENR is used to calibrated a noise receiver up to 40 GHz. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 38: 89–92, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10979