On the robustness of LDD and nMOS transistors subjected to measurement of drain breakdown voltage : Shian Aur and Amitava Chatterjee. Solid-St. Electron.33(8), 1043 (1990)

• Book ID: 103284460
• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 132 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90138-b