On the Relation Between Growth Instabilities and Internal Stress Evolution during Galvanostatic Ti Thin Film Anodization

✍ Scribed by Vanhumbeeck, J.-F.; Proost, J.

• Book ID: 121860578
• Publisher: The Electrochemical Society
• Year: 2008
• Tongue: English
• Weight: 435 KB
• Volume: 155
• Category: Article
• ISSN: 0013-4651
• DOI: 10.1149/1.2958306