✦ LIBER ✦
On the relation between damage rate and stress level evolution in α-Cr2O3 thin films growing on Ni–33at%Cr
✍ Scribed by R. Siab; C. Huvier; M. Kemdehoundja; J.L. Grosseau-Poussard; J.F. Dinhut
- Book ID
- 116385291
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 262 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0010-938X
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