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On the Regularity of Distribution for a Solution of SDE of a Jump Type with Arbitrary Levy Measure of the Noise

✍ Scribed by A. M. Kulik


Publisher
Springer
Year
2005
Tongue
English
Weight
453 KB
Volume
57
Category
Article
ISSN
0041-5995

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## Abstract A new method for the determination of a distributed FET noise model is presented. It is based on the extraction of the intrinsic noise‐correlation matrix of an elemental section of the device from the device's noise figure, measured for only one source‐impedance state at a number of fre