On the quality of contacts in a-Si:H staggered electrode thin-film transistors

✍ Scribed by Schropp, R.E.I.; Veltkamp, J.W.C.; Snijder, J.; Verwey, J.F.

• Book ID: 114595262
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 453 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1985.22192