On the phenomenological model of preferred sputtering for SIMS and Auger profiling: A critical analysis

✍ Scribed by N.J. Chou; M.W. Shafer

• Book ID: 118983240
• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 1014 KB
• Volume: 92
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(80)90226-5