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On the nature of electroluminescence at 1.5 μm in the breakdown mode of reverse-biased Er-doped siliconp-n-junction structures grown by sublimation molecular beam epitaxy

✍ Scribed by A. V. Kornaukhov; A. A. Ezhevskii; M. O. Marychev; D. O. Filatov; V. G. Shengurov


Book ID
111444839
Publisher
Springer
Year
2011
Tongue
English
Weight
219 KB
Volume
45
Category
Article
ISSN
1063-7826

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