𝔖 Bobbio Scriptorium
✦   LIBER   ✦

On the Measurement of Impurity Atom Distributions in Silicon by the Differential Capacitance Technique

✍ Scribed by Kennedy, D. P.; Murley, P. C.; Kleinfelder, W.


Book ID
115468224
Publisher
IBM
Year
1968
Tongue
English
Weight
642 KB
Volume
12
Category
Article
ISSN
0018-8646

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES