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On the interpretation of noise in thick-film resistors : J. A. Ringo, E. H. Stephens and D. A. Gilbert. IEEE Trans. Parts, Hybrids, PackagingPHP-12 (4), 378 (December 1976)

Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 133 KB
Volume: 16
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(77)90868-x

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High-voltage damage and low-frequency noise in thick-film resistors : E. Henry Stevens, Daniel A. Gilbert and John A. Ringo. IEEE Trans. Parts, Hybrids, PackagingPHP-12 (4), 351 (December 1976)

📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 133 KB