High-voltage damage and low-frequency noise in thick-film resistors : E. Henry Stevens, Daniel A. Gilbert and John A. Ringo. IEEE Trans. Parts, Hybrids, PackagingPHP-12 (4), 351 (December 1976)

• Publisher: Elsevier Science
• Year: 1977
• Tongue: English
• Weight: 133 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(77)90864-2