On the injection level dependencs of the minority carrier lifetime in defected silicon substrates: P. De Pauw, R. Mertens, R. Van Over-Straeten and S.C. Jain Solid St. Electron. 27, 573 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 181 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(85)80152-x