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On the influence of backscattered electrons on the lateral resolution in scanning auger microscopy

✍ Scribed by J. Kirschner


Book ID
104991077
Publisher
Springer
Year
1977
Tongue
English
Weight
388 KB
Volume
14
Category
Article
ISSN
1432-0630

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We have demonstrated recently the operation of depolarization near-Ðeld scanning optical microscopy (DP-NSOM), a technique that allows optical near-Ðeld imaging with uncoated optical Ðbre tips by making use of the depolarizing e †ect of the tip-sample near-Ðeld. We have shown both experimentally and