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On the gate-to-drain current ratio in junction FETs at low temperature

✍ Scribed by L.M. Rucker; E.R. Chenette; A. Ambrozy

Book ID: 107856322
Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 192 KB
Volume: 21
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(78)90034-5

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