On the collapse of drain I-V characteristics in modulation-doped FET's at cryogenic temperatures

✍ Scribed by Fischer, R.; Drummond, T.J.; Klem, J.; Kopp, W.; Henderson, T.S.; Perrachione, D.; Morkoc, H.

• Book ID: 114594816
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 588 KB
• Volume: 31
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1984.21655