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On the gate- and drain-voltage dependence of the RTS amplitude in submicron MOSTs

โœ Scribed by E. Simoen; B. Dierickx; B. Canne; F. Thoma; C. Claeys


Publisher
Springer
Year
1994
Tongue
English
Weight
632 KB
Volume
58
Category
Article
ISSN
1432-0630

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