On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt–Si and its effect on the electrical properties

✍ Scribed by Silva, J.P.B.; Sekhar, K.C.; Rodrigues, S.A.S.; Pereira, M.; Parisini, A.; Alves, E.; Barradas, N.P.; Gomes, M.J.M.

• Book ID: 121989224
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 811 KB
• Volume: 278
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2012.11.161