Contact angle determinations were made to allow us to study the effect of the wavelength of illumination on the surface of hydrogenated amorphous silicon thin films. The films were prepared by the PECVD technique from pure silane under conditions which give good quality material. Advancing and reced
On the Effect of the Amorphous Silicon Microstructure on the Grain Size of Solid Phase Crystallized Polycrystalline Silicon
โ Scribed by Kashish Sharma; Annalisa Branca; Andrea Illiberi; Frans D. Tichelaar; Mariadriana Creatore; Mauritius C. M. van de Sanden
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 561 KB
- Volume
- 1
- Category
- Article
- ISSN
- 1614-6832
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Experiments on the bending of silicon crystals at elevated temperature show that the ease with which polygonization occurs depends on the orientation of the bending crystal. If the crystal is oriented so that only one slip system operates in a given region, an homogeneous aggregation of dislocations
We conclude that further experiments are necessary to determine whether the very strong indirect evidence for boundary segregation can or cannot be supported directly by experiments on polonium in lead-bismuth alloys.
The eect of dierent post-deposition treatments on the structure of Hot-Wire (HW) deposited intrinsic a-Si:H thin ยฎlms is investigated. These treatments are applied in order to rehydrogenate the top region of the ยฎlm, which, due to the high deposition temperatures of these ยฎlms, becomes depleted of h