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On the defect structure of chromium sulphide

✍ Scribed by S. Mrowec; M. Zastawnik


Publisher
Elsevier Science
Year
1966
Tongue
English
Weight
297 KB
Volume
27
Category
Article
ISSN
0022-3697

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The tie structure of thin films of chromium electrodeposited on fee substrates has been investigated by electron microscopy, in an attempt to relate substrate/deposit epitaxy to the development of high internal stress in the deposits. The structure of these tlhns has been found to be insensitive to