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On the Correlation between Morphology and Electronic Properties of Fluorinated Copper Phthalocyanine (F 16 CuPc) Thin Films

โœ Scribed by Ye, Rongbin; Baba, Mamoru; Ohishi, Yoshiyuki; Mori, Kunio; Suzuki, Kazunori


Book ID
120620261
Publisher
Taylor and Francis Group
Year
2006
Tongue
English
Weight
357 KB
Volume
444
Category
Article
ISSN
1542-1406

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Thin films of hexadecafluorophthalocyanine (F 16 CuPc) were grown by organic molecular beam deposition (OMBD) under ultra high vacuum (UHV) conditions on oxidized Si(0 0 1) substrates. The film thicknesses ranged from 120 to 450 A and the substrate temperature was varied from )150 to 300 ยฐC. X-ray d