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On the correlation between morphology and electronic properties of copper phthalocyanine (CuPc) thin films

✍ Scribed by L. Grządziel; J. Żak; J. Szuber

Book ID
108388676
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
644 KB
Volume
436
Category
Article
ISSN
0040-6090

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Thin films of hexadecafluorophthalocyanine (F 16 CuPc) were grown by organic molecular beam deposition (OMBD) under ultra high vacuum (UHV) conditions on oxidized Si(0 0 1) substrates. The film thicknesses ranged from 120 to 450 A and the substrate temperature was varied from )150 to 300 °C. X-ray d