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On the calculation of doping profiles from C(V) measurements on two-sided junctions

✍ Scribed by De Man, H.J.J.

Book ID: 114590012
Publisher: IEEE
Year: 1970
Tongue: English
Weight: 208 KB
Volume: 17
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1970.17131

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