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On Stable Oscillations and Equilibriums Induced by Small Noise

โœ Scribed by Mark I. Freidlin

Book ID
111537343
Publisher
Springer
Year
2001
Tongue
English
Weight
243 KB
Volume
103
Category
Article
ISSN
0022-4715

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## Abstract Channel noise enhancement due to MOSFET scaling and its influence on phase noise estimation of fully integrated VCO have been studied. The channel noise of MOSFET increases due to the hot electron effect of small geometry MOSFET is obvious. The channel noise coefficient, __ฮณ__, of NMOS