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Test and Diagnosis for Small-Delay Defects || Diagnosing Noise-Induced SDDs by Using Dynamic SDF

✍ Scribed by Tehranipoor, Mohammad; Peng, Ke; Chakrabarty, Krishnendu


Book ID
120249148
Publisher
Springer New York
Year
2011
Weight
827 KB
Category
Article
ISBN
1441982973

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