𝔖 Bobbio Scriptorium

✦ LIBER ✦

On mechanical stresses at cracks in dielectrics with application to dielectric breakdown

✍ Scribed by McMeeking, Robert M.

Book ID: 115472138
Publisher: American Institute of Physics
Year: 1987
Tongue: English
Weight: 756 KB
Volume: 62
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.339361

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A J-integral for the analysis of electri

A J-integral for the analysis of electrically induced mechanical stress at cracks in elastic dielectrics

✍ Robert M. McMeeking 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 780 KB

Implications from the influence of elect

Implications from the influence of electrohydrodynamic motion on breakdown with respect to the discharge mechanism in dielectric liquids

✍ Frei, C.J.; He, L.; Muller, K. 📂 Article 📅 1989 🏛 IEEE 🌐 English ⚖ 486 KB

[IEEE ICDL'96. 12th International Confer

[IEEE ICDL'96. 12th International Conference on Conduction and Breakdown in Dielectric Liquids - Roma, Italy (15-19 July 1996)] ICDL'96. 12th International Conference on Conduction and Breakdown in Dielectric Liquids - Monochannel propagation mechanism in transformer oil at low breakdown probabilities

✍ Torshin, Yu. 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 695 KB

[IEEE 3rd International Conference on Pr

[IEEE 3rd International Conference on Properties and Applications of Dielectric Materials - Tokyo, Japan (8-12 July 1991)] [1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials - Electrical treeing and stress cracking in polyethylene at cryogenic temperature

✍ Wu Weihan, ; Hao Fengnian, 📂 Article 📅 1991 🏛 IEEE 🌐 English ⚖ 796 KB

[IEEE ICSD'98. 1998 IEEE 6th Internation

[IEEE ICSD'98. 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics - Vasteras, Sweden (22-25 June 1998)] ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) - Breakdown behaviour of polyethylene at dc voltage stress

✍ Riechert, U.; Eberhardt, M.; Kindersberger, J.; Speck, J. 📂 Article 📅 1998 🏛 IEEE ⚖ 473 KB

[IEEE 2009 IEEE 9th International Confer

[IEEE 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials (ICPADM) - Harbin, China (2009.07.19-2009.07.23)] 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials - Mechanism on breakdown phenomenon of cable joint with impurities

✍ Chen, Chengwei; Liu, Gang; Lu, Guojun; Wang, Jin 📂 Article 📅 2009 🏛 IEEE ⚖ 438 KB