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[IEEE 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials (ICPADM) - Harbin, China (2009.07.19-2009.07.23)] 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials - Mechanism on breakdown phenomenon of cable joint with impurities

โœ Scribed by Chen, Chengwei; Liu, Gang; Lu, Guojun; Wang, Jin


Book ID
118060422
Publisher
IEEE
Year
2009
Weight
438 KB
Volume
0
Category
Article
ISBN
1424443679

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